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DOI : https://doi.org/10.31001/tekinfo.v8i2.800
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DOI : https://doi.org/10.31001/tekinfo.v8i2.804
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DOI : https://doi.org/10.31001/tekinfo.v8i2.813
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DOI : https://doi.org/10.31001/tekinfo.v8i2.818
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DOI : https://doi.org/10.31001/tekinfo.v8i2.830
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DOI : https://doi.org/10.31001/tekinfo.v8i2.850
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DOI : https://doi.org/10.31001/tekinfo.v8i2.862
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DOI : https://doi.org/10.31001/tekinfo.v8i2.854
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